Highly Accelerated Stress Test System EHS

  • Humidity resistance evaluation tests for electronic components
  • Wet and dry bulb temperature control (M) conforms to IEC60068-2-66 standard
  • Protection measures for specimen
  • Double stack model (MD) allows saving space and two different tests at the same time
  • Air-circulating fan for high accuracy testing
  • 12 specimen signal terminal pins (more available as option)   
  • Air-HAST environment as option  

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