Meets International Standards
The TSD chamber achieves various tests from major international standards such as MIL, IEC, JIS.
Specimen Temperature Trigger (STT) function
The TSD-100 chamber now includes a STT function. It monitors the specimen temperature using two sensors attached to the specimen and starts to count the exposure time, or proceeds to the next step once the specimen temperature reaches the preset temperature. This eliminates the need for pretesting, reducing the overall test time and ensures an accurate specimen temperature attainment. The specimen and test area temperatures can be recorded by connecting a temperature recorder.
Smooth specimen transfer
The "Soft-move-mode" is used to reduce vibration shocks when specimens are moving between the high and low temperature chambers in 10 sec.
Test area anti-drop mechanism to protect specimens
A braking system fitted to the drive mechanism prevents specimens from falling into the test area when the chamber stops operation.
Easy wiring access
A cable port is provided on the right side to allow easy wiring of specimen for measurement during high and low temperature cycle tests (optional cable port can also be provided on the left side).
Large 100L capacity test area
Featuring a 100L test area capacity, the chamber dramatically increases the processing capabilities and even allows to test A4 size printed circuit boards laid flat at once.
Optimized size for low-volume testing
The compact thermal shock chamber answers to the need for small or low-volume specimens testing. Featuring a wide test area in a slim design, the TSE chamber offers high performances that meet severe test requirements.
Large 10.9L capacity test area
Features a 10.9L test area, twice that of our previous model. The volume that can be processed is greatly increased, and a 210 x 297mm printed circuit board can be tested in the horizontal position.(*TSA-22 with 22L is also available. For detailed information, please contact ESPEC.)
Easy wiring access
A cable port is provided on the right side to allow easy wiring of specimens for measurement during high and low-temperature cycle tests.
in mm (WxHxD)
in mm (excl. projection)
|TSD-101-W||+60 to +200°C / -65 to 0°C||NO||-||-||100 l||710 x 345 x 410||1100 x 1885 x 1965|
|TSE-12-A||High Temp 60°C to 200°C /low temp -65 to 0°C||NO||-||-||10.9 l||320 x 148 x 230||680 x 1625 x 1050|
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